The aim of the course is to provide knowledge about optical systems and the imaging process in such. The course begins by introducing the paraxial formalism for thin and thick lenses. Since no optical system is perfect, a major part of the course treats how much various systems deviate from ideal ones, i.e. their aberrations, both chromatic and monochromatic. To treat aberrations, general ray tracing equations are derived. Based on these, general expressions for all basic types of aberrations are derived, which then are used for assessing both their origin and occurrence in different types of systems. The course then develops methods and strategies for optimizing optical systems for minimal aberrations or how systems can be designed so their images are free of certain types of aberrations. The course also deals with the impact of diffraction on image quality. It includes both laboratory exercises and design and analysis of optical system on a computer by a ray tracing program.
